MT222 Quality Control Methods in Mfg
Explores quality control methods used in semiconductor manufacturing, including statistical process control (SPC), control charts, performance representation and capability measurements. Emphasizes computer manipulation of actual data for analysis and design of quality. Prerequisites: STAT 243 or MT 108, and WR 227. Audit available. (See course content and outcomes.)
Credits: 3
| CRN | Class type | Location | Days & time | Dates | Seats available | Faculty | More info |
|---|---|---|---|---|---|---|---|
| 20541 | Online | Not applicable | Available 24/7 | From April 1 through June 15, 2024 | Eric J Kirchner | Books for CRN 20541
Class details for CRN 20541 Notes: Distance Hybrid course meets on campus 1 hour per week | |
| and In-person | Rock Creek BLDG7 214 | Monday from 3 to 3:50pm | From April 1 through June 15, 2024 |
Class schedule definitions
- Cost:
- cost is based on the number of credits – see tuition and fees
- Books:
- $0 or <$40 means low cost books (doesn't include other supplies like calculators)
- Register:
- use the CRN to register in MyPCC – see how to register
- Class types:
- see more about class types
- In-person: classes take place at specific times and locations. Attendance in person is required.
- Online: classes do not have meeting times. Regular online interaction is required and there are weekly assignments.
- Remote: classes take place at specific times online. Students must be logged in during class meeting times.
- In-person and remote: classes meet both in-person and remotely. Attendance at both is required.
- In-person and online: classes meet in-person with additional online activities required.
- Remote and online: classes meet remotely with additional online activities required.