MT222 Quality Control Methods in Mfg
Explores quality control methods used in semiconductor manufacturing, including statistical process control (SPC), control charts, performance representation and capability measurements. Emphasizes computer manipulation of actual data for analysis and design of quality. Prerequisites: STAT 243 or MT 108, and WR 227. Audit available. (See course content and outcomes.)
Credits: 3
| CRN | Class type | Location | Days & time | Dates | Seats available | Faculty | More info |
|---|---|---|---|---|---|---|---|
| 20476 | Online (no scheduled meetings) | Not applicable | Available 24/7 | From March 30 through June 13, 2026 | Eric J Kirchner | Books for CRN 20476
Class details for CRN 20476 Notes: Distance Hybrid course meets on campus 1 hour per week | |
| and In-person | Rock Creek BLDG7 214 | Friday from 2:30 to 3:20pm | From March 30 through June 13, 2026 |
Class schedule definitions
- Cost:
- cost is based on the number of credits – see tuition and fees
- Books:
- $0 or <$40 means low cost books (doesn't include other supplies like calculators)
- Register:
- use the CRN to register in MyPCC – see how to register
- Class types:
- see more about class types
-
- In-Person: Instructional time will happen in-person. Class meetings take place at specific times and locations.
- Online (no scheduled meetings): Instruction will take place through regular online activities and assignments with scheduled due dates. Classes do not have meeting times.
- Online (scheduled meetings): Instructional time will happen online. Class meetings will take place at scheduled days/times online.
- In-person & Online (scheduled meetings): Class meetings take place at a specific time & day, with some meetings in-person and some online, usually in Zoom.
- In-person & Online (no scheduled meetings): Class meetings are in-person and have additional online activities.
- Online (scheduled meetings) & Online (no scheduled meetings): classes meet remotely with additional online activities required.