Explores quality control methods used in semiconductor manufacturing, including statistical process control (SPC), control charts, performance representation and capability measurements. Emphasizes computer manipulation of actual data for analysis and design of quality. Prerequisites: MTH 243 and WR 227 Audit available.  (For detailed information, see the Course Content and Outcome Guide ).

Credits:
3.00
Registration:
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Fees:
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Textbooks:
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  CRN Campus / Bldg / Rm Time Days Dates
 
WEB » 20882 - Canceled!
Instructor: STAFF
Web Course: Important - See Course Information Page.
Tuition: credit Fees: $0.00
For information, contact Rock Creek
 
WEB » 23797 - 31-Mar-2014 thru 14-Jun-2014
Instructor: Eric J Kirchner
Web Course: Important - See Course Information Page.
Tuition: credit Fees: $20.00
For information, contact Rock Creek